As we continue our efforts to measure quality infrastructure (QI) development and improve QI data collection to understand QI’s contribution to economic growth, we turn our attention to metrology. We examined the relationship between the Global Quality Infrastructure Index (GQII) and the number of metrology patents filed to understand whether it would be a suitable proxy for metrology development. We expect a strong positive relationship between the variables of interest, suggesting that countries with higher metrological competencies will likely have more metrology patent applications.